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Registration of
Certified Environment Survey
Measurement Services
Our experienced technicians analyze environmental and drainage water measurement as well as material analysis.
Toshima's environment analysis center is registered as a "Certified Environmental Survey Measurement Services".
Analysis type / Our equipment
ICP-AES : SII SPS3000
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SII SPS3000
ICP-AES (Inductively Coupled Plasma - Atomic Emission Spectrometer) is capable of simultaneous analysis from main elements to a small amount of elements.
X‐ray diffraction (XRD) : Rigaku TTR II
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Rigaku TTR II
XRD (X-ray diffraction) analysis evaluates elements' phase based on diffracting grating data.
X‐ray Fluorescence (XRF) : SHIMADZU EDX-720
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SHIMADZU EDX-720
XRF (X-ray Fluorescence) analyzes composition for various elements and clarifies contaminants.
Particle Size Distribution Measuring : NIKKISO Microtrac MT3000
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NIKKISO Microtrac MT3000
Particle Size Distribution Measuring analyzer radiates laser for unknown powder, measures scattered pattern by 79 light receiving elements, and calculates grain size distribution.
Scanning electron microscope (SEM) : KEYENCE VE-7800
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KEYENCE VE-7800
SEM (Scanning Electron Microscope) analyzes micro structure on sample's surface and thin film thickness at maximum 100,000 magnifications.
Absorption spectrophotometer : HITACHI U-1900
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HITACHI U-1900
Absorption spectrophotometer analyzes nitrogen and phosphorus in solutions as well as transmission of thin films.
Thermo gravimetry - Differential Thermal Analysis (TG-DTA) : MAC Science 2000S
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MAC Science 2000S
TG (Thermo gravimetry) measures weight change for samples' oxidization, heat decomposition, and dehydration as well as evaluates heat resistivity and response speed.
DTA (Differential Thermal Analysis) detects transition and reaction temperature for samples.
